AGILENT SUPERNOVA SCXRD
GENERAL INFORMATION | STANDARD OPERATING PROCEDURE
A single crystal X-ray diffractometer which can be used to determine full crystal structures of organic and inorganic solids. System consists of a Mo/Cu dual micro-focus source of 40W (0.8mA at 50 kV). Kappa Geometry Goniometer with 0.00125° resolution for Omega and Theta, 0.0025 °for Kappa and 0.005 °for Phi. Scanning speed range of 0.005-3.0 °/sec. Eos S2 CCD detector. The sample can be cooled or heated between 100-400 K.
For more information please contact Dr. Daniel Paley.