ZEISS SIGMA VP SCANNING ELECTRON MICROSCOPE
SERVICE REQUEST FORM
LABORATORY ACCESS PROTOCOL
ELECTRON MICROSCOPY RULES AND SAFETY MANUAL
TRAINING AND CERTIFICATION
EQUIPMENT LIST AND RATES
FEI TALOS F200X S-TEM
ZEISS SIGMA VP SCANNING ELECTRON MICROSCOPY
This Sigma family new Schottky Thermal Field emission SEM consists of Gemini objective lens design combining electrostatic and magnetic fields to maximize optical performance while reducing field influences at the sample to a minimum. The SEM uses several complimentary detection technologies to characterize the imaged samples including a recently installed EDS. The microscope is not designated for biological sample imaging, but this can be allowed for certain cases with specific approval from the lab staff.
The SEM is located in CEPSR 1016 and maintained by the staff of the CNI.
Model: SIGMA VP
Wafer Size: 100 mm
Resolution: 12.00 Å
Magnification: 10X to 1,000,000X
Electron Gun: Schottky Thermal Field Emission Type
Extracting Voltage (Vext): 0 to 6.5kV
Acceleration Voltage (Vacc): 0 to 30 kV
For an introductory period, training is conducted by experienced and trained representatives of each research group. Certification is done by superusers only.
ZEISS SEM SUPERUSERS AND STAFF:
Training request form - Link
EDS training request form - Link
Ipshita Datta | firstname.lastname@example.org
Dr. Amirali Zangiabadi | email@example.com
Dr. Nava Ariel-Sternberg | firstname.lastname@example.org