ZEISS SIGMA VP SCANNING ELECTRON MICROSCOPE
This Sigma family new Schottky Thermal Field emission SEM consists of Gemini objective lens design combining electrostatic and magnetic fields to maximize optical performance while reducing field influences at the sample to a minimum. The SEM uses several complimenting detection technologies to characterize the imaged samples.
The SEM is located in CEPSR 1016 and maintained by the CNI.
SPECIFICATIONS | Standard Operating Procedure
- Manufacturer: Zeiss
- Model: SIGMA VP
- Wafer Size: 100 mm
- Resolution: 12.00 Å
- Magnification: 10X to 1,000,000X
- Electron Gun: Schottky Thermal Field Emission Type
- Extracting Voltage (Vext): 0 to 6.5kV
- Acceleration Voltage (Vacc): 0 to 30 kV
For an introduction period, training is conducted by experienced and trained representatives of each research group. Certification is done by superusers only.
SEM SUPERUSERS AND STAFF
Diego Scarabelli | firstname.lastname@example.org
Charishma Puliyanda Subbaiah | email@example.com
Scott Trocchia | firstname.lastname@example.org
Dr. Christopher Goulbourne | email@example.com
Dr. Nava Ariel-Sternberg | firstname.lastname@example.org