ZEISS SIGMA VP SCANNING ELECTRON MICROSCOPE


This Sigma family new Schottky Thermal Field emission SEM consists of Gemini objective lens design combining electrostatic and magnetic fields to maximize optical performance while reducing field influences at the sample to a minimum. The SEM uses several complimenting detection technologies to characterize the imaged samples. The microscope is not designated for biological sample imaging but can be allowed for certain cases with specific approval from the lab staff.

The SEM is located in CEPSR 1016 and maintained by the CNI.

SPECIFICATIONS | Standard Operating Procedure | Training request form

  • Manufacturer: Zeiss
  • Model: SIGMA VP
  • Wafer Size: 100 mm
  • Resolution: 12.00 Å
  • Magnification: 10X to 1,000,000X
  • Electron Gun: Schottky Thermal Field Emission Type
  • Extracting Voltage (Vext): 0 to 6.5kV
  • Acceleration Voltage (Vacc): 0 to 30 kV

MACHINE SCHEDULE

For an introduction period, training is conducted by experienced and trained representatives of each research group. Certification is done by superusers only.

ZEISS SEM SUPERUSERS AND STAFF:

Training request form - Link

Changjian (Julia) Zhang | cz2376@columbia.edu

Ipshita Datta | id2263@columbia.edu

Dr. Christopher Goulbourne | cg2929@columbia.edu

Dr. Nava Ariel-Sternberg | na2661@columbia.edu