AGILENT SUPERNOVA SCXRD
+ SHARED LABS HOME
+ EXTERNAL USER PROGRAM
+ CNI LABS NEWSLETTER
+ BADGER
+ CLEAN ROOM
- CLEAN ROOM HOME
- CLEAN ROOM ACCESS PROTOCOL
- EQUIPMENT TRAINING
- PROCESS & FABRICATION
- EQUIPMENT LIST
- EQUIPMENT RATES & SUPERUSERS
- EQUIPMENT STATUS
- SAFETY
- RELATED LINKS
+ ELECTRON MICROSCOPY
- EM LAB HOME
- SERVICE REQUEST FORM
- EM LAB ACCESS
- TRAINING & CERTIFICATION
- EQUIPMENT LIST & RATES
- FEI TALOS S-TEM
- ZEISS SIGMA VP SEM
- EM IMAGE GALLERY
+ SHARED MATERIAL CHARACTERIZATION LAB
GENERAL INFORMATION | STANDARD OPERATING PROCEDURE
A single crystal X-ray diffractometer which can be used to determine full crystal structures of organic and inorganic solids. System consists of a Mo/Cu dual micro-focus source of 40W (0.8mA at 50 kV). Kappa Geometry Goniometer with 0.00125° resolution for Omega and Theta, 0.0025 °for Kappa and 0.005 °for Phi. Scanning speed range of 0.005-3.0 °/sec. Eos S2 CCD detector. The sample can be cooled or heated between 100-400 K.
For more information please contact Dr. Philippe Chow.