AGILENT SUPERNOVA SCXRD

GENERAL INFORMATION | STANDARD OPERATING PROCEDURE

Location: Havemeyer 544

The Agilent SuperNova is a single-crystal X-ray diffractometer used to determine the complete three-dimensional atomic and molecular structure of crystalline materials. This instrument employs X-ray diffraction to precisely measure the positions of atoms within a crystal lattice, providing full structural information including bond lengths, bond angles, and molecular geometry. The system features a Mo/Cu dual microfocus X-ray source of 40W (0.8 mA at 50 kV) and an Eos S2 CCD detector. It is equipped with a kappa geometry goniometer offering high-resolution positioning: 0.00125° for Omega and Theta, 0.0025° for Kappa, and 0.005° for Phi, with a scanning speed range of 0.005-3.0°/sec. Temperature control allows sample analysis between 100-400 K, enabling both cryogenic and elevated temperature measurements.

The system is commonly used for complete structure determination of small organic molecules, metal-organic frameworks (MOFs), coordination complexes, and inorganic solids. Applications include confirming the identity of synthesized compounds, studying intermolecular interactions, analyzing polymorphs, and investigating temperature-dependent structural changes.

For more information please contact Dr. Luca Telesca and check out the XRD selection guide..