BRUKER DIMENSION AFM

GENERAL INFORMATION | STANDARD OPERATING PROCEDURE

PROBE REPLACMENT POLICY

Location: Havemeyer 542

The Bruker Dimension is an atomic force microscope (AFM) that provides high-resolution three-dimensional surface imaging and characterization at the nanoscale. This instrument uses a sharp probe tip mounted on a cantilever to scan sample surfaces, measuring topography, roughness, and various surface properties with sub-nanometer vertical resolution and nanometer-scale lateral resolution. The system is equipped with multiple scanners: FastScan (default) and Icon (available upon request). Topographical imaging is typically performed in PeakForce mode using Bruker's ScanAsyst technology for automated optimization and gentle sample interaction. Advanced modes are also available with additional training, including Kelvin Probe for surface potential mapping, Piezoresponse Force Microscopy for ferroelectric materials, Quantitative Nanomechanical Mapping for mechanical property analysis, and Conductive AFM for electrical characterization. The system can image samples in ambient air, controlled environments, or liquid, making it suitable for biological samples, polymers, thin films, and hard materials.

Common applications include surface roughness measurements, particle size analysis, film thickness determination, examination of surface features and defects, and nanoscale characterization of electrical and mechanical properties.

Please contact Dr. Luca Telesca for more information.