FILMETRICS THIN FILM MEASUREMENT SYSTEM
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OPERATING INSTRUCTIONS
GENERAL INFORMATION
The F40-UV filmetrics is a microscope-based thin film measurement system that uses reflective light to measure optical properties and thickness of thin films. The system contains UV light source for more accurate measurement.
SPECIFICATIONS
The system can measure 4 nm to 40 um thickness and in the 190-1100 nm wavelength range. It is recommended to know what type of layers are present on the sample and rough estimation of thicknesses.
CONTACT INFORMATION
For additional information about the filmetrics, please contact the clean room staff at: cniCR@columbia.edu.