PARK ATOMIC FORCE MICROSCOPE

GENERAL INFORMATION

The Park Systems FX40 is an advanced atomic force microscope for high-resolution imaging and nanoscale material characterization. Unique automation features are designed to increase productivity in imaging and sample characterization. The FX40 ease-of-use features include automated tip exchange, auto laser alignment, multi-sample navigation, and SmartScan auto imaging.

The FX40 operational modes include:

Basic AFM topography imaging

  • contact/LFM/friction

  • intermittent tapping / non-contact

  • force modulation FMM

Advanced AFM techniques for material characterization

  • Magnetic Force Microscopy MFM

  • Electrostatic Force EFM / Kelvin Probe KPFM

  • Piezoresponse Force PFM

  • Nanomechanical maps of stiffness/modulus/adhesion PinPoint

  • Conductive AFM

  • Nanolithography / Nanomanipulation

  • Force spectroscopy and nanoindentation

SPECIFICATIONS

Boasts 3 XY scanner sizes: 10 um x 10 um, 50 um x 10 um or 100 um x 100 um.

  • Maximum stage speed of 0.8mm/s

  • Maximum Z height of 15 um

  • Maximum resolution of 0.19 A.

CONTACT INFORMATION
For additional information about the Park Systems FX-40, please contact James Vichiconti at jv2534@columbia.edu or contact the clean room staff at: cniCR@columbia.edu.