PHI 5500 XPS
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GENERAL INFORMATION | STANDARD OPERATING PROCEDURE
Location: Havemeyer 544
This XPS system is used for thin film surface analysis of elemental composition and chemical bonding states. The system consists of a 75x75mm2 sample holder, X-ray Mg/Al dual anode source and an additional monochromatic Al source.
For more information please contact Dr. Luca Telesca or Dr. Philippe Chow.