PANALYTICAL XPERT3 POWDER XRD
GENERAL INFORMATION | STANDARD OPERATING PROCEDURE
Location: Havemeyer 544
The PANalytical X'Pert3 Powder is an X-ray diffractometer used for phase identification, quantitative phase analysis, and structural characterization of polycrystalline materials. This instrument uses X-ray diffraction to analyze the crystalline structure of powdered samples, identifying crystalline phases and determining crystal structure parameters. The system is operated in Bragg-Brentano geometry and consists of a 3 kW generator, fully ceramic Cu Long Fine Focus (LFF) X-ray tube, vertical goniometer (theta-theta configuration), and a PIXcel 1D detector for rapid data collection with high resolution and signal-to-noise ratio. An Anton-Paar TTK 450 stage enables measurements across a temperature range of -173 to 400°C for in-situ studies under controlled thermal conditions. Typical samples are approximately 50 mg, though small and air-sensitive samples can also be accommodated.
The system is commonly used for phase identification, particle size and strain analysis, preferred orientation measurements, and Rietveld refinements. Applications span materials science, chemistry, geology, pharmaceuticals, and ceramics, including characterization of catalysts, minerals, semiconductors, thin films, polymorphs, and nanomaterials for determining phase purity, quantifying phase compositions in mixtures, and studying structural changes induced by processing or environmental conditions.
For more information please contact Dr. Luca Telesca.