GENERAL INFORMATION | STANDARD OPERATING INSTRUCTIONS

Extended Manual

Precise Ion Polishing System uses a focused Ar ion beam to precisely mill TEM samples close to or until a hole is created in their thinned area. The PIPS is recommended to use with physical sciences samples and can create a thin area suitable for imaging by the TEM. The voltage can be tuned between 100 V-8kV to prevent damage to the sample.

For more information please contact Dr. Amirali Zangiabadi.