Rigaku SmartLab XRD

GENERAL INFORMATION | STANDARD OPERATING PROCEDURE

Location: Mudd 1124A

The Rigaku SmartLab is a versatile multipurpose X-ray diffractometer designed for advanced structural characterization of polycrystalline materials, thin films, and nanomaterials. This intelligent X-ray diffraction system combines high-resolution optics, flexible goniometry, and automated guidance software to perform a wide range of measurements including powder diffraction, thin film analysis, reciprocal space mapping, reflectometry, and small-angle X-ray scattering (SAXS). The system features a 3 kW Cu X-ray source coupled with a HyPix-3000 high-energy-resolution 2D multidimensional semiconductor detector that supports 0D, 1D, and 2D measurement modes, allowing all applications to be handled with a single detector and eliminating the inconvenience of preparing and switching individual detectors for different applications. The system incorporates a high-resolution θ/θ closed-loop 5-axis goniometer drive system for precise angular control. Cross-beam optics (CBO) allows for easily switchable Bragg-Brentano (BB) and Parallel Beam (PB) geometries. The SmartLab Guidance software provides expert-system assistance for selecting optimal measurement conditions, with motorized alignment and automated optical configuration enabling rapid switching between measurement geometries without manual intervention.

FEATURES:

  • Cross-beam Optics for easy BB and PB switching

  • Automated Optics and Sample alignment

  • Ge(220) 2- and 4-bounce monochromators

  • Guidance software for data acquisition and processing/analysis

It is commonly used for phase identification, quantitative phase analysis, crystallite size and strain analysis, texture and stress measurements, thin film thickness and composition determination, and epitaxial layer characterization.

For more information please contact Dr. Luca Telesca and check out the XRD selection guide.