BRUKER DIMENSION AFM


GENERAL INFORMATION | STANDARD OPERATING PROCEDURE

The Bruker Dimension AFM is a highly automated, multimode AFM that can image large samples with high resolution. Scan areas up to 40 um are typical with in-plane resolution of 2-10 nm and height resolution under 1 nm. Topography imaging is typically performed in tapping mode using Bruker's ScanAsyst technology, which simplifies data collection for non-advanced users. Numerous advanced modes are also available with additional training. Electrical characterization can be performed in Kelvin probe mode; phase contrast and other nanomechanical measurements are also possible. FastScan mode, which measures topography with a 5-10x improvement in speed, is available on request.

TRAINING AND CONTACT INFORMATION

Training and certification are available on alternating Fridays. Attending a training session is mandatory, even if users have previous experience with other AFMs. Please contact Dr. Daniel Paley for more information.