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GENERAL INFORMATION
The Park Systems FX40 is an advanced atomic force microscope for high-resolution imaging and nanoscale material characterization. Unique automation features are designed to increase productivity in imaging and sample characterization. The FX40 ease-of-use features include automated tip exchange, auto laser alignment, multi-sample navigation, and SmartScan auto imaging.
The FX40 operational modes include:
Basic AFM topography imaging
contact/LFM/friction
intermittent tapping / non-contact
force modulation FMM
Advanced AFM techniques for material characterization
Magnetic Force Microscopy MFM
Electrostatic Force EFM / Kelvin Probe KPFM
Piezoresponse Force PFM
Nanomechanical maps of stiffness/modulus/adhesion PinPoint
Conductive AFM
Nanolithography / Nanomanipulation
Force spectroscopy and nanoindentation
SPECIFICATIONS
Boasts 3 XY scanner sizes: 10 um x 10 um, 50 um x 10 um or 100 um x 100 um.
Maximum stage speed of 0.8mm/s
Maximum Z height of 15 um
Maximum resolution of 0.19 A.
CONTACT INFORMATION
For additional information about the Park Systems FX-40, please contact James Vichiconti at jv2534@columbia.edu or contact the clean room staff at: cniCR@columbia.edu.