WOOLLAM ALPHA-SE ELLIPSOMETER
GENERAL INFORMATION | STANDARD OPERATING PROCEDURE
Ellipsometery measures changes in light polarization to determine a film’s thickness and optical constants. An easy to use system with manual adjustment of polarizer and analyzer for simultaneous measurements of thin film thickness and refractive index. Film thickness between 1 nm – 5 µm can be measured.
For more information please contact Dr. Dan Paley.