WOOLLAM ALPHA-SE ELLIPSOMETER


GENERAL INFORMATION | STANDARD OPERATING PROCEDURE

Ellipsometery measures changes in light polarization to determine a film’s thickness and optical constants. An easy to use system with manual adjustment of polarizer and analyzer for simultaneous measurements of thin film thickness and refractive index. Film thickness between 1 nm – 5 µm can be measured.

For more information please contact Dr. Dan Paley.