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The Wyko NT9100 Optical Profile employs coherence scanning interferometry, also known as white-light interferometry, white-light confocal, or vertical scanning interferometry to produce high quality three-dimensional surface maps of the object under test.
The NEW NT9100S model for photovoltaic (PV) metrology combines nanometer Z-height resolution with millimeter fields of view, providing solar cell manufacturers unprecedented capability to monitor and control surface texture, and to match specific surface measurements to cell efficiency.
- For advanced applications in MEMS, thick films, optics, ceramics, and advanced materials research
- Provides fast data acquisition, user-friendly data analysis, and angstrom-level repeatability
- Features compact size, flexible, expandable configuration and motorized, programmable stage
- Sub-nanometer vertical resolution at all magnifications
- Complete system including Wyko Vision® analysis software and X-Y stage automation option
- Unique dual-LED illumination source provides superior non-contact measurements
NEW NT9100S model for solar cell production features a 156-mm programmable stage and a special porous vacuum chuck to enable edge-to-edge measurements on 6-inch PV cells.
Surface metrology, in particular the measurement of surface roughness, is the study of a surface’s geometry to understand how its roughness and texture can impact behavior or effectiveness. It is also the study of how these parameters are influenced by time, environment, or usage.
Measuring surface roughness is a crucial concern for an immense range of industries and applications, from auto component wear to medical implant efficacy, from micro-electro-mechanical systems (MEMS) inspection to semiconductor thin-film uniformity. The performance and value of thousands of products and systems – from designer sunglass to advanced personal digital devices – is governed by characterizing and controlling microscale surface features, including micro-inch surface roughness. Many of the major advances in science and industry over the past half century would not have been possible without accurate surface roughness metrology.
3D SURFACE METROLOGY
3D surface metrology uses 3D surface profilers to provide non-contact measurement of surface features. These 3D surface profilers include white light based interferometric microscopes (optical profilers) and 3D confocal microscopes. Since the technology is non-contact, it is non-destructive, providing more repeatable and thus more effective surface imaging and measurement. To characterize 3D surfaces, S-parameters have been developed by the ISO standards committee to replace the traditional 2D R-parameters.
3D surface metrology offers the opportunity to generate an enhanced measurement set for accurate surface metrology quantification. For example, the 3D Ssk parameter illustrates load carrying capacity, porosity, and characteristics of non-conventional machining processes. A surface that is smooth but covered with particulates has positive skewness, while a surface with deep scratches will exhibit negative skewness.
For additional information about the Wyko NT9100 Profiler, please contact James Vichiconti at email@example.com.